Verigy provides advanced semiconductor test systems and solutions used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Verigy offers scalable platforms for a wide range of system-on-chip (SOC) test solutions, and memory test solutions for Flash, DRAM including high-speed memories, as well as multi-chip packages (MCP). Verigy also provides advanced analysis tools that accelerate design debug and yield ramp processes.

The VERIGY V93000 is an advanced semiconductor test platform featuring a scalable architecture, capable of testing a broad spectrum of devices. From low-cost IoT devices to high-end components like advanced automotive devices and highly integrated multicore processors, the V93000 offers comprehensive testing capabilities. The platform's universal pin architecture on the PS1600 and AVI64 cards, along with highly integrated RF and mixed signal cards, and best-in-class DPS and VI cards, contribute to increased test coverage, faster time-to-market, and improved test economics.

ADVANTEST / VERIGY

V93000

The Agilent 93000, also known as VERIGY 93000, is a versatile and scalable system-on-a-chip (SOC) testing platform. It serves as a single solution with flexible upgradeability, covering a wide range of applications, including digital, analog, and embedded memory testing. 

93000

Versatest V5000 Series platform, designed to test memory devices, including flash memory and multi-chip packages. We believe our products are especially well-equipped to address the growing challenges in today's semiconductor market.

V5000

***PARTS***

The VERIGY PS400, known as Pin Scale 400, is a high-density, flexible digital Channel Card designed for the V93000 Platform. It caters to a wide range of general-purpose core digital testing needs while complementing Verigy's digital offering. This Pin Card efficiently addresses various application requirements, from structural testing with reduced pin count and DC IO to broadside access functional testing, all within a single instrument, thanks to its flexible license options. The Pin Scale 400 is designed for seamless integration with existing Pin Scale Digital cards, as well as with the complete range of DC, mixed signal, and RF options available for the V93000 platform. It offers functional compatibility with the P and Ce series of digital pin cards. Built upon the proven V93000 test processor per pin architecture, the PS400 features true per pin AC and DC resources, a sequencer per pin structure, APG per pin structure, fail capture per pin, integrated TIA per pin, and new high-speed backbone communication technology, enabling unprecedented data transfer between the test system and the host computer. 

PS400

The VERIGY PS800, also known as the Pin Scale 800, is a highly scalable test solution designed to meet a wide range of performance needs. Starting at 200 Mbps for cost-effective, low-performance requirements, it can scale up to 800 Mbps to cater to higher performance demands, all achieved with a single digital card. With the industry-first Verigy InstaPin performance library and per-pin licenses, the Pin Scale 800 digital card can be configured to match specific device requirements, pin-by-pin, resulting in the most cost-effective testing approach. As test needs evolve for new device classes or next-generation performance, the Pin Scale 800 can be easily reconfigured through software, ensuring maximum return on investment by extending the platform's lifetime. 

PS800

The Versatest Series V4000 memory testers.

V4000

The VERIGY PS1600 is a Final Test system designed to perform comprehensive testing at high speeds and with increased memory and density. With 128 pins operating at 1.6G, it offers twice the speed, twice the memory, and twice the density compared to previous models. This advanced test system ensures efficient and accurate testing, making it a valuable tool for semiconductor manufacturers seeking high-performance and reliable testing solutions for their products.

PS1600

The Versatest Series V4400 memory testers.
High parallelism for all memory devices.


V4400

The VERIGY PS3600 is a channel board utilized in the Pin Scale 3600 test system. It is a component of the V93000 SoC Test System which is a scalable platform architecture that tests a wide range of devices from low cost IoT to high-end devices such as advanced automotive devices or highly integrated multicore processors. The Pin Scale 3600 test system offers greater functionality while maintaining low cost of testing.

PS3600

The VERIGY C400E is a Final test system designed for semiconductor testing applications. It features an LTH (Big) test head, DUT Scale, and 56M scan memory, ensuring comprehensive testing capabilities. The system is equipped with seven GPDPS Power supplies, enabling efficient and accurate power delivery. Additionally, the C400E is equipped with High Speed Cards to cater to high-speed testing requirements, making it a powerful and versatile solution for final testing of semiconductor devices.

C400E

The VERIGY C400 is a cost-optimized test system specifically designed for testing consumer applications. It utilizes lower-grade test processors to achieve cost-effectiveness. The model number indicates the maximum data rate in Gbit/s. As part of the Agilent 93000 SOC Series, the C400 shares the same test processor technology and mechanical design, ensuring compatibility and enabling test programs that cover a wide range of applications.

C400

83000

V3300

The Verigy V93000 Multi-Site Device Power Supply (Multi-Site DPS) is a low cost-of-test DPS solution that provides 8 channels per module for mixed signal applications.

MSDPS

The HP 94000IP photo-image-testing system, part of the HP 94000 family of mixed-signal production-test systems, captures up to 50 two-megapixel frames (more than two million pixels) to meet the needs of next-generation digital imaging products.
Depending on their density, CMOS (Complementary Metal Oxide Semiconductor) chips are expected to cost 40 percent to 50 percent less than today's widely used charge-coupled devices (CCD), and can be tested at speeds ranging from 20MHz to 40MHz.

94000IP

The VERIGY P1000 is a performance-optimized SOC (System-on-a-Chip) test system, specifically designed for testing infrastructure devices. It offers high-performance capabilities for rigorous testing requirements in this domain. Overall, the VERIGY P1000 is a powerful and flexible test system catering to infrastructure devices, ensuring precise and efficient testing to meet the demands of the semiconductor industry.

 P1000

DPS32

DPS500mA

HSM3G

The performance optimized models P1000, P800, and P600 are best suited in testing infrastructure devices. 

P600

The Verigy V6000e is the industry’s first engineering test solution for Flash and DRAM applications with Active Matrix technology for the office environment. Part of the V6000 family, the V6000e brings to the lab or office setting the same powerful testing capabilities of the production V6000 WS and FT systems. 

V6000E

UHC4T

HSM3600

MCB BOARD 8M

Product Specifications
-Modular: 128 or 64 Channels
-1A/ch at 4.5V , 64A/card

DPS64

UHC4

Locally intelligent 32 channel VI for ≤40V or 200mA DC, analog, & power management

PMU32

MCE 8M BOARD

DM800

MBAV8

The DPS128’s per-pin time measurement unit (TMU) enables efficient measurement of high switching frequencies, duty cycles and fast rise/fall times found in today’s advanced power-management devices. With its sophisticated ganging options, this family of instruments can address a broad application space, and also supersedes legacy power instruments within the V93000 portfolio.

DPS128

PS1600B

VI32

82000

V1000

E8001-66495

V2100

UHC4+

With the new AVI64 universal analog pin module, Advantest’s V93000 tester has all of the functionality needed to test advanced SoC devices.

AVI64

Channel count: 64 channels per logic board
Maximum 256 channels for one system
Parallelism: maximum 8-site
Scalability: different kinds of the board can
be mixed and installed on the system
Signal Docking: 256 channel cable mount

E7002-69520

V1200

The cost-optimized models C400 and C200 use lower grade test processors for testing consumer applications. The model number indicates the maximum data rate in Gbit/s.

C200

The VERIGY V5400 is an advanced memory test system specifically designed to test flash memory devices. Its primary purpose is to ensure the reliability of flash memory as storage capacity increases and physical size decreases. This powerful test system offers comprehensive testing capabilities, making it an essential tool for semiconductor manufacturers seeking to verify and validate the performance and quality of their flash memory devices.

V5400

The VERIGY C200E is a sophisticated semiconductor test system developed by Advantest Corporation. This advanced platform is specifically designed to conduct comprehensive testing and verification of integrated circuits (ICs) throughout the manufacturing process. It offers precise and reliable testing capabilities, making it an essential tool for semiconductor manufacturers seeking high-quality and efficient testing solutions for their IC devices.

C200E

 The V6000 WS and FT, the V6000e is supported by patent-pending Active Matrix technology, which delivers breakthrough cost of test (COT), as well as the scalability and flexibility required to perform both Flash and DRAM testing on the same system. 

 V6000FT

(64 pins at 1.6G) 2x Speed 2x Memory + Memory Emulation

PS1600-ME

N2498B

Pin Scale 9G (64 pins at >8G) >2x Speed, 2x Density 2x Memory

PS9G

HSM4000

Chroma 3880

Memory test card
The HSM6800, targeted for volume production test of ultra high-speed memories, offers native 6.8Gbps at-speed I/O and at-speed memory core access testing up to 64-sites GDDR5 in parallel as well as superior accuracy for best device quality and manufacturing yields.

HSM6800

Versatest V5500 Series system is a highly scalable high-volume production test system configured for final test of packaged devices, and optimized for final test of MCPs. When equipped with our optional Programmable Interface Matrix, it can be scaled to test up to 512 devices and up to 24,576 pins in parallel. Like our other Versatest V5000 Series platforms, the Versatest V5500 Series system performance can test up to 200 Megahertz data rates.

V5500

The Versatest Series V4100 memory testers

V4100

E7124-04124

SE-UDPS

V1100

9490

84000

94000

E8012-66401

P800

The VERIGY 93000 CTH (Channel Testhead) is a crucial component of the ADVANTEST 93000 series of semiconductor test systems, extensively utilized in the semiconductor industry for testing and characterizing integrated circuits (ICs) during production. As an essential part of the overall test system, the CTH is responsible for providing specific functions required for accurate and efficient testing of IC devices.

93000 CTH

V6000

E7996-66403

Versatest V5000e Series system is a full function but less expensive and lower volume memory test system designed for use in the research and development environment. It provides engineers a relatively inexpensive test tool for testing small numbers of devices in prototype development that provides all of the functionality of an expensive production test system and can be used to avoid the expense and inefficiency of taking a more expensive, high-volume test system out of production. Programs developed for the Versatest V5000 Series system can be quickly transferred to our Versatest V5400 and V5500 Series systems for high volume production, helping shorten customers' time to market.

V5000E

E7002-66630

V101 platform, introduced in the third quarter of fiscal year 2009, designed to test highly cost-sensitive devices such as 4, 8 and 16-bit micro-controller units (“MCUs”) and consumer mixed-signal devices.

V101

E8010

LTE Advanced, 802.11ac, WiMAX, Zero Overhead Upload

MBAV8+

F120t

E8001-61670

F80t

E8001-66412

V93K MSDPS CABLE 

The V6000 WS and FT, the V6000e is supported by patent-pending Active Matrix technology, which delivers breakthrough cost of test (COT), as well as the scalability and flexibility required to perform both Flash and DRAM testing on the same system. 

 V6000WS

I/O Channel Memory Depth (no mixed configurations possible): 8M

ADVANTEST / VERIGY

개요

활성 등재물

총 제품 수

서비스

상위 제품

V93000

93000

V5000

PARTS

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