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Hitachi High-Technologies S-9200 CD Scanning Electron Microscope환경 설정
CD Sem 23.11.08 Converted to 6 inch, Clear WaferOEM 모델 설명
The Hitachi S-9220 CD-SEM is a high-resolution, automated tool for precise CD measurements. It is designed for inline process control and development in semiconductor manufacturing. With programmable addressing and pattern recognition, it accurately measures various structures. It supports 6-inch and 8-inch wafer loading and provides easy data access via Hitachi software and a Data Station. The S-9220 CD-SEM is an essential tool for semiconductor manufacturers, offering superior resolution and automation for reliable CD measurements.문서
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HITACHI
S-9220
카테고리
CD-SEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
105224
웨이퍼 사이즈:
알 수 없음
빈티지:
2001
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설명
Hitachi High-Technologies S-9200 CD Scanning Electron Microscope환경 설정
CD Sem 23.11.08 Converted to 6 inch, Clear WaferOEM 모델 설명
The Hitachi S-9220 CD-SEM is a high-resolution, automated tool for precise CD measurements. It is designed for inline process control and development in semiconductor manufacturing. With programmable addressing and pattern recognition, it accurately measures various structures. It supports 6-inch and 8-inch wafer loading and provides easy data access via Hitachi software and a Data Station. The S-9220 CD-SEM is an essential tool for semiconductor manufacturers, offering superior resolution and automation for reliable CD measurements.문서
문서 없음