8250-R
카테고리
CD-SEM개요
The 8250-R reticle CD control system, which is based on the 8200/8400 CD SEM platform. The 8250-R provides extremely precise and high-throughput measurements on advanced reticles used in the production of sub-0.13-micron devices.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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