Compass 300 Inspection system, tailored for monitoring processes up to the 100nm tech node. Detect critical flaws efficiently using OMNIView™, a cutting-edge laser scanning method that captures diverse defects across all layers.

Applied Materials is committed to accelerating this new PPACt playbook for our customers and partners. We have the broadest and deepest portfolio of products for delivering PPACt innovations to the market. This portfolio encompasses the ability to create and deposit, shape and remove, modify, analyze, and connect materials and devices in new ways. We are unique in having a broad suite of process technology and metrology capabilities under one roof, and we have highly differentiated silicon and packaging lab capabilities. Our Integrated Materials Solutions co-optimize materials deposition, removal, modification, and analysis to create new materials and engineer new structures for high-performance, low-power chips at leading-edge nodes.

APPLIED MATERIALS (AMAT)

COMPASS 300

FCB44AFB-77F1-4738-80E9-A30616D0F266_4_5005_c.jpeg

CB890202-6FB3-4A1F-A804-211D6AF1C1B2_4_5005_c.jpeg

95C17A4D-4F1F-4793-AFCB-6431088110D3_4_5005_c.jpeg

CC9A06EA-6964-44DC-AC18-D3C34D49503D_4_5005_c.jpeg

8214CCE5-D471-4D70-95CC-D6271603732C_4_5005_c.jpeg

F251A681-EA31-48E0-BBFE-FFE2AF530A3F_4_5005_c.jpeg

460AB72F-CC0B-4792-B679-2EB18D076AC1_4_5005_c.jpeg

BB2E81BE-E1D3-4F0B-AB20-DE376F851E5F_4_5005_c.jpeg

FCF3651A-0F62-4423-AFAA-EA2CEF11CBDA_4_5005_c.jpeg

3494C686-2EBD-440D-B865-F4231AD22861_4_5005_c.jpeg

79B78C6A-CC2B-47C0-8A6C-85C656542FE6_4_5005_c.jpeg

9DABA396-A772-46A5-A869-BBCEBDA2A5AB_4_5005_c.jpeg

3A1FACF2-B73F-493A-959E-816C954EE536_4_5005_c.jpeg

65CF3030-E381-4657-8CB6-EBB88A028345_4_5005_c.jpeg

EA30B102-4028-4B57-B7E0-A1AF09CA3CC6_4_5005_c.jpeg

COMPASS 300

카테고리

개요

활성 등재물

서비스

상위 등재물

Moov에 등재하고 즉시 완벽한 구매자를 찾으십시오.