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SEMVISION G10
개요
The SEMVision G10 is a defect analysis system developed by Applied Materials. It integrates novel cold field emission (CFE) technology and offers industry-leading, sub-1nm resolution to address many of today’s challenges. This high resolution is a critical enabler for EUV photoresist review at >10x reduced eBeam dose.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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