설명
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope환경 설정
Inspection LD: 2ea, AsystInspection SEMOEM 모델 설명
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.문서
문서 없음
APPLIED MATERIALS (AMAT)
SEMVISION G2
검증됨
카테고리
Defect Inspection
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Running
제품 ID:
93121
웨이퍼 사이즈:
알 수 없음
빈티지:
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기유사 등재물 없음
APPLIED MATERIALS (AMAT)
SEMVISION G2
검증됨
카테고리
Defect Inspection
마지막 검증일: 6일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Running
제품 ID:
93121
웨이퍼 사이즈:
알 수 없음
빈티지:
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope환경 설정
Inspection LD: 2ea, AsystInspection SEMOEM 모델 설명
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.문서
문서 없음
유사 등재물
모두 보기유사 등재물 없음