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설명
설명 없음환경 설정
-Software Version: 5.3.10 -CIM: 10.93.22.120 -Process: Defect review sem -Main System SEMVision G3 LITE Qty 1 (OK) -Factory Interface FOUP Qty 2 (OK) -Others Electronic Rack Qty 1 (OK) Missing/Faulty Parts / Accessories List: -OM Controller Qty 1OEM 모델 설명
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
104929
웨이퍼 사이즈:
12"/300mm
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
104929
웨이퍼 사이즈:
12"/300mm
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
-Software Version: 5.3.10 -CIM: 10.93.22.120 -Process: Defect review sem -Main System SEMVision G3 LITE Qty 1 (OK) -Factory Interface FOUP Qty 2 (OK) -Others Electronic Rack Qty 1 (OK) Missing/Faulty Parts / Accessories List: -OM Controller Qty 1OEM 모델 설명
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.문서
문서 없음