SPARK
개요
Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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