설명
FEI Company Expida 1285 (DA300)환경 설정
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEM 모델 설명
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 2일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
137369
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
EXPIDA 1285
카테고리
Defect Inspection
마지막 검증일: 2일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
137369
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
FEI Company Expida 1285 (DA300)환경 설정
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEM 모델 설명
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.문서
문서 없음