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eScan 430
개요
Fast e-beam inspection for process development and production monitoring for 3D NAND and other advanced chips. The HMI eScan 430 is a high-throughput e-beam wafer inspection system, capable of detecting patterning and electrical defects.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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