WI-2200
개요
The ICOS WI-2200/2300, which perform 100% automated optical inspection and metrology of microelectronic devices on a variety of wafer substrates. This inspection system combines surface inspection and 2D bump inspection for semiconductor ICs, optoelectronics, advanced packaging, and MEMS.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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