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CI-9250

카테고리
Defect Inspection
개요

Component Inspector, tray-based. CI-8250/8450 and CI-9250/9450 products are high volume systems that perform 2D and 3D inspection of all devices that are handled in trays such as QFP, BGA, CSP and TSOP. ICOS CI-9x50 is a fully automatic system for the final inspection of tray-based semiconductor components; it moves the components to the inspection stations, sorts them and, if required, transfers them to tape.

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