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2020
개요
The KLA 2020 is die older-generation model, which has both inspection and critical-dimension measurement (CD) capability. CD is the measurement of the circuit and line dimensions on the wafer, which are typically on the order of one micron or less.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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