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eS20XP
개요
In 1999, we developed the eS20, which has performance enhancements compared to the previous generation of e-beam defect inspection systems. In July of 2000 the eS20XP, which delivers further improvements in sensitivity while increasing throughput.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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