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2905
개요
The 2905 is an optical broadband plasma wafer defect inspector that provides the ability to capture yield-relevant defects on 2Xnm memory and logic devices. This advanced technology allows for improved quality control and increased efficiency in the manufacturing process.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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