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KLA SPECTRAFX 100
    설명
    설명 없음
    환경 설정
    Tool is already deinstalled and in warehouse. Tool was fully functional prior to deinstallation. Inspect to confirm configuration and condition of tool. Tool Model : SpectraShape 8660 Software version: 6.20.30.10105 System power rating: 208 AC 2 Phase Loading Configuration: 3 loaders (auto) Operating System: Microsoft Windows XP 1. Handler Unit 2. Metrology Unit No missing or damaged parts reported. <u>Note:</u> Unable to verify if tool&#39;s nameplate is present, and may pose an issue for shipment to China (CCIC) Need inspect to confirm.
    OEM 모델 설명
    SpectraFx 100 is KLA-Tencor’s next-gen thin film metrology solution that meets the process control requirements for 90nm devices, including 193nm DUV lithography processes. It supports next-gen and “operator-free” 300mm fabs with advanced automation and tool-to-tool matching capabilities, reducing process development time for advanced materials and accelerating their adoption into volume production. It also enables extensive product wafer monitoring and characterization required to accurately measure advanced thin films. It fully supports SEMI requirements for communication to automation tracks and materials process flow, delivering the precision, stability, and matching required for advanced thin film-measurement applications for 90nm device production. It achieves exceptional tool-to-tool matching and enables the use of a small spot size on product wafers, eliminating the use of monitor wafers.
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    KLA

    SPECTRAFX 100

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    검증됨

    카테고리

    Defect Inspection
    마지막 검증일: 60일 이상 전
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    13871


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    2017

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA SPECTRAFX 100
    KLASPECTRAFX 100Defect Inspection
    빈티지: 2003조건: 중고
    마지막 검증일60일 이상 전

    KLA

    SPECTRAFX 100

    verified-listing-icon

    검증됨

    카테고리

    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-8DrvTXRmkWm9zjuoC3A_Nz2GF3lOOqRKgLVAYeAJEcE-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    13871


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    2017


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    Tool is already deinstalled and in warehouse. Tool was fully functional prior to deinstallation. Inspect to confirm configuration and condition of tool. Tool Model : SpectraShape 8660 Software version: 6.20.30.10105 System power rating: 208 AC 2 Phase Loading Configuration: 3 loaders (auto) Operating System: Microsoft Windows XP 1. Handler Unit 2. Metrology Unit No missing or damaged parts reported. <u>Note:</u> Unable to verify if tool&#39;s nameplate is present, and may pose an issue for shipment to China (CCIC) Need inspect to confirm.
    OEM 모델 설명
    SpectraFx 100 is KLA-Tencor’s next-gen thin film metrology solution that meets the process control requirements for 90nm devices, including 193nm DUV lithography processes. It supports next-gen and “operator-free” 300mm fabs with advanced automation and tool-to-tool matching capabilities, reducing process development time for advanced materials and accelerating their adoption into volume production. It also enables extensive product wafer monitoring and characterization required to accurately measure advanced thin films. It fully supports SEMI requirements for communication to automation tracks and materials process flow, delivering the precision, stability, and matching required for advanced thin film-measurement applications for 90nm device production. It achieves exceptional tool-to-tool matching and enables the use of a small spot size on product wafers, eliminating the use of monitor wafers.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA SPECTRAFX 100
    KLA
    SPECTRAFX 100
    Defect Inspection빈티지: 2003조건: 중고마지막 검증일: 60일 이상 전