설명
KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz환경 설정
환경 설정 없음OEM 모델 설명
The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.문서
KLA
2139
검증됨
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
89679
웨이퍼 사이즈:
8"/200mm
빈티지:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
2139
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
89679
웨이퍼 사이즈:
8"/200mm
빈티지:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available