Damaged parts：
1.Robot-ABM407
2.Track motor

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

AIT UV™ is a high-throughput, high-sensitivity wafer inspection product that uses Dual AOD technology to increase scan rate, UV laser illumination for increased sensitivity, and advanced detection algorithms for improved defect capture. It also features real-time Adaptive Mode™ technology, three-channel double-darkfield optics, MultiSpot™ illumination, and Inline Automatic Defect Classification (iADC) for faster results. It is part of KLA-Tencor’s AIT family of inspection systems and is designed for 300-mm inspection and excursion monitoring at 100-nm design rules and below.

AIT UV

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KLA

AIT UV

Defect Inspection

유사 등재물

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

AIT UV

Defect Inspection

유사 등재물

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV

KLA

AIT UV