KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

In 2001,  we  introduced  the 2430  macro  ADI  series,  which brought the benefits of the 2401's advanced analysis capabilities, high throughput  and advanced detection  algorithms  to 300 mm  production. Macro defects,  which can ruin the entire wafer, are especially  costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger  wafers as compared to 200 mm wafers. The 2430 is the first  automated  macro ADI  system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs.         Backside Wafer Inspection

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

KLA

VIPER 2430

Defect Inspection

유사 등재물

KLA

VIPER 2430

VIPER 2430

Defect Inspection

유사 등재물

KLA

VIPER 2430