The KLA-224 Automatic Reticle Inspection System is designed for dedicated, high-volume reticle inspection applications. This system gives you extremely high throughput on SX and 1 OX reticles, and provides repeating defect inspection for photomasks and multi­die reticles. 

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

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