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eDR-7000
개요
The eDR-7000 is an electron-beam wafer defect review and classification system that utilizes a third-generation immersion column and an advanced stage to quickly and accurately re-locate, image and classify yield-critical defects.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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