설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The eDR7380 high performance electron-beam (e-beam) wafer defect review and classification system produces a comprehensive defect pareto in one test for accurate defect sourcing and faster excursion detection during production. Unique synergy with our inspectors facilitates accurate identification and classification of patterned wafer, bare wafer and bevel edge defects for faster yield learning during IC and wafer manufacturing.문서
문서 없음
KLA
eDR-7380
카테고리
Defect Inspection
마지막 검증일: 27일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
127088
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
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Refurbishment Services
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설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The eDR7380 high performance electron-beam (e-beam) wafer defect review and classification system produces a comprehensive defect pareto in one test for accurate defect sourcing and faster excursion detection during production. Unique synergy with our inspectors facilitates accurate identification and classification of patterned wafer, bare wafer and bevel edge defects for faster yield learning during IC and wafer manufacturing.문서
문서 없음