B30 is a tool that uses darkfield, brightfield, and color imaging to detect 2D defects on the backside of wafers. It is incorporated into the Explorer Cluster for enhanced functionality.

Onto Innovation is a worldwide leader in the design, development, manufacture and support of process control tools that perform macro defect inspections and metrology, lithography systems, and process control analytical software used by semiconductor wafer and advanced packaging device manufacturers. 

B30

카테고리

개요

활성 등재물

서비스

상위 등재물

Moov에 등재하고 즉시 완벽한 구매자를 찾으십시오.