설명
설명 없음환경 설정
-Platform is specified for ISO5 -Filter wheel with color selection (RGB) -1x, 3x, 5x, 10x , 20x review -Has a OCR reader -Dark field function implemented -It can use the Discovery/True ADC software for offline review -CD measurements are possible, but there is no separate optic available for this -Bare wafers only. Must be modified if sawn wafers are on frame.OEM 모델 설명
The F30™ System is an advanced inspection tool designed to blur the lines between dark field micro inspection and traditional macro inspection. It provides automated defect inspection for front-end and outgoing quality (OQA) applications. The system boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite, the F30 System redefines inspection cost of ownership expectations. It has a throughput of up to 120 wph (10µm) and resolution flexibility (10µm to 0.5µm). It also has three simultaneous color defect review methods: on-the-fly, high resolution, whole wafer. The F30 System is suitable for a variety of applications including After develop inspection (ADI), Fab Outgoing QA, Post CMP inspection, and After etch inspection. It can also team with edge and backside modules for an all-surface solution.문서
문서 없음
ONTO / RUDOLPH / AUGUST
F30
검증됨
카테고리
Defect Inspection
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
77528
웨이퍼 사이즈:
6"/150mm, 8"/200mm
빈티지:
2015
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / RUDOLPH / AUGUST
F30
검증됨
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
77528
웨이퍼 사이즈:
6"/150mm, 8"/200mm
빈티지:
2015
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
-Platform is specified for ISO5 -Filter wheel with color selection (RGB) -1x, 3x, 5x, 10x , 20x review -Has a OCR reader -Dark field function implemented -It can use the Discovery/True ADC software for offline review -CD measurements are possible, but there is no separate optic available for this -Bare wafers only. Must be modified if sawn wafers are on frame.OEM 모델 설명
The F30™ System is an advanced inspection tool designed to blur the lines between dark field micro inspection and traditional macro inspection. It provides automated defect inspection for front-end and outgoing quality (OQA) applications. The system boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite, the F30 System redefines inspection cost of ownership expectations. It has a throughput of up to 120 wph (10µm) and resolution flexibility (10µm to 0.5µm). It also has three simultaneous color defect review methods: on-the-fly, high resolution, whole wafer. The F30 System is suitable for a variety of applications including After develop inspection (ADI), Fab Outgoing QA, Post CMP inspection, and After etch inspection. It can also team with edge and backside modules for an all-surface solution.문서
문서 없음