M-2000U
카테고리
Elipsometry개요
245-1000nm, 470 wavelengths Ideal for many thin films: dielectrics, organics, semiconductors, metals, and more. Measure optical constants and thickness for coatings from subnanometer to tens of microns.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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