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ALERIS 8330
카테고리
Elipsometry개요
The AlerisTM 8330 film metrology system, a targeted solution for production monitoring of the thickness, refractive index and stress of non-critical films at the 32nm node and beyond.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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