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SENDURO 200
카테고리
Elipsometry개요
Ellipsometer for routine applications Very fast measurement of films between a few angstrom and more than 50µm thickness. - Cassette to cassette load for 200 mm and 300 mm wafers - Spectral range 290 – 850 nm - Recipe based measurements - Proprietary ellipsometer software SpectraRay/3
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
- 제품을 찾을 수 없음