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NX1032XS
카테고리
Final Test개요
IC Test Handler Up to 32 site testing capability Testing area from 344mm x 244mm Up to 480kgf contact force UPH - up to 20,000 (Ambient) & Up to 10,500 (High Temperature)
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
- 제품을 찾을 수 없음