ULTRASCAN 9600
카테고리
Metrology개요
UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.
활성 등재물
1
서비스
검사, 보험, 감정, 물류
UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.
1
검사, 보험, 감정, 물류
