AFS-300
카테고리
Metrology개요
The AFS-300 series systems operate in a class 10 cleanroom, utilizing ADE's E-Plus station for precision. They measure wafer properties with high accuracy (0.25 microns), including thickness, flatness, shape, conductivity, and resistivity. Integration with factory automation is seamless through standard protocols.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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