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KLA / ADE WAFERSIGHT
    설명
    설명 없음
    환경 설정
    PHASE SHIFT
    OEM 모델 설명
    A new wafer flatness and shape metrology tool for 300mm and advanced 200mm production, the WaferSight measurement precision allows wafer and device manufacturers to meet ITRS metrology requirements down to the 35nm generation. Utilizing optical technologies, the WaferSight system extends ADE’s market presence in wafer dimensional metrology.
    문서

    문서 없음

    KLA / ADE

    WAFERSIGHT

    verified-listing-icon

    검증됨

    카테고리
    Metrology

    마지막 검증일: 3일 전

    주요 품목 세부 정보
    조건:

    Used

    작동 상태:

    알 수 없음

    제품 ID:

    104683

    웨이퍼 사이즈:

    알 수 없음

    빈티지:

    2005

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology
    빈티지: 2005조건: 중고
    마지막 검증일3일 전
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    KLA / ADE

    WAFERSIGHT

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 3일 전
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/d628b30a219b4c3c9d5641f208610282_20241119111832950_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/bac75782d80443bea9fb9c22cb03dc86_2024111911183295007_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/eeb14414f6354e3dbe3d1fe6fba9ff10_2024111911183295011_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/4492f866b2c646f1a581d535dc53a0f7_2024111911183295008_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/fca69f8e5f65493882229e957d7c625b_906ce58dbc2a4cbfb472a6af2a5457a71201a_mw.jpeg
    주요 품목 세부 정보
    조건:

    Used

    작동 상태:

    알 수 없음

    제품 ID:

    104683

    웨이퍼 사이즈:

    알 수 없음

    빈티지:

    2005

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    PHASE SHIFT
    OEM 모델 설명
    A new wafer flatness and shape metrology tool for 300mm and advanced 200mm production, the WaferSight measurement precision allows wafer and device manufacturers to meet ITRS metrology requirements down to the 35nm generation. Utilizing optical technologies, the WaferSight system extends ADE’s market presence in wafer dimensional metrology.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology빈티지: 2005조건: 중고마지막 검증일:3일 전
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology빈티지: 0조건: 중고마지막 검증일:60일 이상 전