설명
CDE Resistivity RESPROBE The CDE Resmap 4 point resistivity mapper is used for measuring resistivity across the wafer for substrates and thin films deposited in the facility.환경 설정
The resistivity range is 2mOhm/Square to 5MOhm/square. Contour plots, 3D plots, histograms, data exporting are supported from the Windows XP based control system. Type Table Top Wafer load Manual Wafer size 2” to 8” Mini Environment N/A Probe Changer N/A Aligner N/A Size 12” x 19” x 10” Range 1mΩ/☐ to 10MΩ/☐ Accuracy 0.5% Repeatability 0.02% static Repeatability 0.1% dynamicOEM 모델 설명
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).문서
문서 없음
CDE
ResMap 178
검증됨
카테고리
Metrology
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
46839
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
CDE
ResMap 178
검증됨
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
46839
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
CDE Resistivity RESPROBE The CDE Resmap 4 point resistivity mapper is used for measuring resistivity across the wafer for substrates and thin films deposited in the facility.환경 설정
The resistivity range is 2mOhm/Square to 5MOhm/square. Contour plots, 3D plots, histograms, data exporting are supported from the Windows XP based control system. Type Table Top Wafer load Manual Wafer size 2” to 8” Mini Environment N/A Probe Changer N/A Aligner N/A Size 12” x 19” x 10” Range 1mΩ/☐ to 10MΩ/☐ Accuracy 0.5% Repeatability 0.02% static Repeatability 0.1% dynamicOEM 모델 설명
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).문서
문서 없음