SpectraShape 9000
카테고리
Metrology개요
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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