S3000SX
카테고리
Metrology개요
The S3000SX thin film metrology system is for transparent films in advanced semiconductor fabrication applications at the 28nm node and below.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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The S3000SX thin film metrology system is for transparent films in advanced semiconductor fabrication applications at the 28nm node and below.
0
검사, 보험, 감정, 물류