NX-WAFER
카테고리
Metrology개요
Automated AFM metrology system for semiconductor and related fabrications. Provides wafer fab inspection and analysis, automatic defect review for bare wafers and substrates, and CMP profile measurements. Capable of scanning 300 mm wafers
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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