VEECO

V220SI	

DUVX 200

DEKTAK 200 SI

FPP 100

DUVX-210

FPP 5000

AP 150

Dimension Vx 210

he Dektak 3 Surface Profilometer is an instrument to measure the vertical profile of samples, thin film thickness, and other topographical features, such as film roughness or wafer bowing.
A diamond stylus is moved vertically into in contact with the sample and then moved laterally across the sample for a specified distance and specified contact force. The instrument can measure small surface variations in vertical stylus displacement as a function of position. The Dektak profilometer can measure small vertical features ranging in height from 100 Å to 650,000 Å on a 5″ Diameter Sample Stage.

DEKTAK 3

M3400ML

X-Ray Fluorescence Thickness and Composition Measurement Tool

SYSTEM XR

DEKTAK I

DI3100

DEKTAK OPS-1100

The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.

DEKTAK 3030

UVX310

VEECO

개요

활성 등재물

총 제품 수

서비스

상위 VEECO Metrology

DUVX 200

2 등재물

V220SI

2 등재물

DEKTAK 200 SI

1 등재물

FPP 100

1 등재물

Moov에 등재하고 즉시 완벽한 구매자를 찾으십시오.

모든 VEECO Metrology