메인 콘텐츠로 건너뛰기
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
KLA ARCHER 200
    설명
    REG TOOL, CU
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
    문서

    문서 없음

    KLA

    ARCHER 200

    verified-listing-icon

    검증됨

    카테고리
    Overlay

    마지막 검증일: 23일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    73808


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay
    빈티지: 0조건: 중고
    마지막 검증일23일 전

    KLA

    ARCHER 200

    verified-listing-icon
    검증됨
    카테고리
    Overlay
    마지막 검증일: 23일 전
    listing-photo-dd4b672902a74601a1ac9d3694ffd8fc-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    73808


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    REG TOOL, CU
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay빈티지: 0조건: 중고마지막 검증일:23일 전
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay빈티지: 0조건: 중고마지막 검증일:60일 이상 전