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PA300
카테고리
Probers개요
The PA300 is a precise and flexible semi-automated test solution for wafers and substrates up to 300 mm. It is ideal for failure analysis (FA), device characterization and modeling from DC to 500 GHz.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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