설명
설명 없음환경 설정
6" X-Y BASE UNIT w/CONTROLLER RING CARRIER Rectangular Probe Card Holder 6" STD CHUCKTOP MICROSCOPE with ARM ASSY ILLUMINATOR ASSY PZ-5 Z-STAGE, 0.25MIL RES MONITOR & KEYBOARD ASSY AUTOALIGN UNIT w/CCD CAMERA OPTIC ASSY WAFER PROFILER KIT 6" INCH BELT TRACK UNIT RS-232, TTL & GPIB INTERFACE AUTO ALIGN SOFTWARE DK VERSION EPROM BASED PROVISION. CE O/S 220VAC,60 Hz INPUT VOLTAGEOEM 모델 설명
Introducing the EG2001x Automatic Wafer Prober: Designed for semiconductor wafers, it handles 150mm wafers of silicon, glass, or polyimide-coated glass, with the option to use stainless steel, PEN on alumina, and other substrates. Automate loading, alignment, and probing of multiple wafer locations effortlessly. Additionally, it offers manual operation for added flexibility.문서
문서 없음
MARTEK / ELECTROGLAS (EG)
EG2001X
검증됨
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
94787
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
MARTEK / ELECTROGLAS (EG)
EG2001X
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
94787
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
6" X-Y BASE UNIT w/CONTROLLER RING CARRIER Rectangular Probe Card Holder 6" STD CHUCKTOP MICROSCOPE with ARM ASSY ILLUMINATOR ASSY PZ-5 Z-STAGE, 0.25MIL RES MONITOR & KEYBOARD ASSY AUTOALIGN UNIT w/CCD CAMERA OPTIC ASSY WAFER PROFILER KIT 6" INCH BELT TRACK UNIT RS-232, TTL & GPIB INTERFACE AUTO ALIGN SOFTWARE DK VERSION EPROM BASED PROVISION. CE O/S 220VAC,60 Hz INPUT VOLTAGEOEM 모델 설명
Introducing the EG2001x Automatic Wafer Prober: Designed for semiconductor wafers, it handles 150mm wafers of silicon, glass, or polyimide-coated glass, with the option to use stainless steel, PEN on alumina, and other substrates. Automate loading, alignment, and probing of multiple wafer locations effortlessly. Additionally, it offers manual operation for added flexibility.문서
문서 없음