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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) N1501A
  • KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) N1501A
  • KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) N1501A
  • KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) N1501A
설명
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환경 설정
N1501A/101/104 (Probe only) Dielectric probe
OEM 모델 설명
The Keysight Technologies, Inc. N1501A dielectric probe kit determines the dielectric properties, or complex permittivity, of many materials. A material’s dielectric properties are determined by its molecular structure. If the molecular structure changes, so will the dielectric properties. Measurements of the dielectric properties of a material can be used to indirectly measure other properties of the material that are also correlated to the molecular structure, and can be a valuable alternative when the property of interest is difficult to measure directly.
문서

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카테고리
Probers

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

90736


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

N1501A

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검증됨
카테고리
Probers
마지막 검증일: 60일 이상 전
listing-photo-7d73e1865a8d40a3ba5975c19e11eddd-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

90736


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
N1501A/101/104 (Probe only) Dielectric probe
OEM 모델 설명
The Keysight Technologies, Inc. N1501A dielectric probe kit determines the dielectric properties, or complex permittivity, of many materials. A material’s dielectric properties are determined by its molecular structure. If the molecular structure changes, so will the dielectric properties. Measurements of the dielectric properties of a material can be used to indirectly measure other properties of the material that are also correlated to the molecular structure, and can be a valuable alternative when the property of interest is difficult to measure directly.
문서

문서 없음