메인 콘텐츠로 건너뛰기
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 더 알아보기

Moov logo

Moov Icon
MPI TS2500
  • MPI TS2500
  • MPI TS2500
  • MPI TS2500
설명
Production Wafer Prober
환경 설정
환경 설정 없음
OEM 모델 설명
High-performance solution for on-wafer applications, offering RF measurements up to 67 GHz and broadband integration up to 220 GHz. Ideal for RF, DC, and high-power testing (up to 10 kV/400 A), it ensures 24/7 production reliability with safety interlocks. Ergonomically designed for seamless wafer handling, supporting up to 200 mm wafers and advanced optics for precise alignment. Compatible with thermal chucks (20–300 °C) and thin wafer handling down to 50 µm. Experience unparalleled accuracy and efficiency in semiconductor testing.
문서

문서 없음

verified-listing-icon

검증됨

카테고리
Probers

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

120217


웨이퍼 사이즈:

8"/200mm


빈티지:

알 수 없음


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

MPI

TS2500

verified-listing-icon
검증됨
카테고리
Probers
마지막 검증일: 60일 이상 전
listing-photo-67900db4347b419996a06d202dfc1ba7-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

120217


웨이퍼 사이즈:

8"/200mm


빈티지:

알 수 없음


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Production Wafer Prober
환경 설정
환경 설정 없음
OEM 모델 설명
High-performance solution for on-wafer applications, offering RF measurements up to 67 GHz and broadband integration up to 220 GHz. Ideal for RF, DC, and high-power testing (up to 10 kV/400 A), it ensures 24/7 production reliability with safety interlocks. Ergonomically designed for seamless wafer handling, supporting up to 200 mm wafers and advanced optics for precise alignment. Compatible with thermal chucks (20–300 °C) and thin wafer handling down to 50 µm. Experience unparalleled accuracy and efficiency in semiconductor testing.
문서

문서 없음