설명
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.환경 설정
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM 모델 설명
미제공문서
문서 없음
AMBIOS TECHNOLOGY, INC
XP-2
검증됨
카테고리
Profiler
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
53545
웨이퍼 사이즈:
알 수 없음
빈티지:
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기유사 등재물 없음
AMBIOS TECHNOLOGY, INC
XP-2
카테고리
Profiler
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
53545
웨이퍼 사이즈:
알 수 없음
빈티지:
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.환경 설정
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM 모델 설명
미제공문서
문서 없음
유사 등재물
모두 보기유사 등재물 없음