The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400Î¼m with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.

AMBIOS TECHNOLOGY, INC

XP-2

Profiler

유사 등재물

XP-2

Profiler

유사 등재물