Metrology system
crated and in storage in US

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.

P-16+

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KLA

P-16+

Profiler

유사 등재물

KLA

P-16+

KLA

P-16+

KLA

P-16+

KLA

P-16+

KLA

P-16+

KLA

P-16+

P-16+

Profiler

유사 등재물

KLA

P-16+

KLA

P-16+

KLA

P-16+

KLA

P-16+

KLA

P-16+

KLA

P-16+