We deliver superior solutions for temperature control, semiconductor analysis and bond process control.

The Wafer Profiler CVP21 is a handy tool to measure doping profiles in semiconductor layers by Electrochemical Capacitance Voltage Profiling (ECV-Profiling, CV-Profiling) in semiconductor research or production. This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of semiconductors.

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

WEP CONTROL

개요

활성 등재물

총 제품 수

서비스

상위 WEP CONTROL Profiler

CVP21

Moov에 등재하고 즉시 완벽한 구매자를 찾으십시오.

모든 WEP CONTROL Profiler