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KLA RS75
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    OEM 모델 설명
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
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    KLA

    RS75

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    검증됨

    카테고리
    Resistivity / Four Point Probe

    마지막 검증일: 22일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    115185


    웨이퍼 사이즈:

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    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
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    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probe
    빈티지: 0조건: 개조됨
    마지막 검증일21일 전

    KLA

    RS75

    verified-listing-icon
    검증됨
    카테고리
    Resistivity / Four Point Probe
    마지막 검증일: 22일 전
    listing-photo-3660467605a842e089c16f16384cfcf2-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    115185


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Auto
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probe빈티지: 0조건: 개조됨마지막 검증일:21일 전
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probe빈티지: 0조건: 중고마지막 검증일:22일 전
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probe빈티지: 0조건: 중고마지막 검증일:60일 이상 전