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KLA RS75/tc
  • KLA RS75/tc
  • KLA RS75/tc
  • KLA RS75/tc
  • KLA RS75/tc
  • KLA RS75/tc
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OEM 모델 설명
The OmniMap® RS75/tc is a resistivity mapping system designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical, such as ion implantation, metallization, diffusion, epitaxy and polysilicon. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. With measurement speed of approximately 1 second per test site, the tool can process a 25-slot cassette of 200mm wafers at over 100 wafers per hour. This includes five-site monitoring, with automatic temperature compensation and flat alignment. The RS75 series is offered in a variety of configurations to meet customer production requirements.
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검증됨

카테고리
Resistivity / Four Point Probe

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

120926


웨이퍼 사이즈:

알 수 없음


빈티지:

2000


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

RS75/tc

verified-listing-icon
검증됨
카테고리
Resistivity / Four Point Probe
마지막 검증일: 60일 이상 전
listing-photo-fb2790bd800b45388b1420073201a1a9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/fb2790bd800b45388b1420073201a1a9/59bdb1e482ab4f158e6dda79c5dbf94c_7224718ae39f4892b7dd5f02a82183d31201a_mw.jpeg
listing-photo-fb2790bd800b45388b1420073201a1a9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/fb2790bd800b45388b1420073201a1a9/d77fceb605ee4d49865f0fa14881f0d3_bd272ef9bccb4798b7d80732fbffac951201a_mw.jpeg
listing-photo-fb2790bd800b45388b1420073201a1a9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/fb2790bd800b45388b1420073201a1a9/9f8ac14f5e4740fdab1b736285b06a01_956809ccf0f743bf8b32f3ee68a13c5b1201a_mw.jpeg
listing-photo-fb2790bd800b45388b1420073201a1a9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/fb2790bd800b45388b1420073201a1a9/5d9257969384443a949558e555ad907e_eafe487388464c65b7737bf0599a2f28_mw.jpeg
listing-photo-fb2790bd800b45388b1420073201a1a9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75229/fb2790bd800b45388b1420073201a1a9/80e80be6b53549058c524fe65bbdd7b5_0cb42f6e9ab94f79b61ad091e150096b1201a_mw.jpeg
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

120926


웨이퍼 사이즈:

알 수 없음


빈티지:

2000


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
환경 설정 없음
OEM 모델 설명
The OmniMap® RS75/tc is a resistivity mapping system designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical, such as ion implantation, metallization, diffusion, epitaxy and polysilicon. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. With measurement speed of approximately 1 second per test site, the tool can process a 25-slot cassette of 200mm wafers at over 100 wafers per hour. This includes five-site monitoring, with automatic temperature compensation and flat alignment. The RS75 series is offered in a variety of configurations to meet customer production requirements.
문서

문서 없음