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224
개요
The KLA-224 Automatic Reticle Inspection System is designed for dedicated, high-volume reticle inspection applications. This system gives you extremely high throughput on SX and 1 OX reticles, and provides repeating defect inspection for photomasks and multidie reticles.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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