설명
No missing parts System was shutdown according to normal procedure Stage air bearing was damaged before shutting down환경 설정
LDS3300M Macro-Module 30um Head - sensitivity for surface defects down to 10um 100% Wafer Surface Inspection 200mm+300mm - Bare & Pattern Wafers Throughput 200mm - 140 WPH 300mm - 130 WPHOEM 모델 설명
미제공문서
문서 없음
KLA / VISTEC / LEICA
LDS 3300M
검증됨
카테고리
Reticle / Mask Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
23604
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA / VISTEC / LEICA
LDS 3300M
카테고리
Reticle / Mask Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
23604
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
No missing parts System was shutdown according to normal procedure Stage air bearing was damaged before shutting down환경 설정
LDS3300M Macro-Module 30um Head - sensitivity for surface defects down to 10um 100% Wafer Surface Inspection 200mm+300mm - Bare & Pattern Wafers Throughput 200mm - 140 WPH 300mm - 130 WPHOEM 모델 설명
미제공문서
문서 없음