HELIOS G4 PFIB HXe
카테고리
SEM / FIB개요
The Thermo Scientific™ Helios™ G4 PFIB HXe DualBeam System provides unique capabilities to enable damage-free delayering of 10nm semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.
활성 등재물
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서비스
검사, 보험, 감정, 물류
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