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설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The Helios NanoLab 400S is a DualBeam system from FEI that integrates both ion and electron beams for FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution.문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled / Uncrated
제품 ID:
119646
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400S
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled / Uncrated
제품 ID:
119646
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The Helios NanoLab 400S is a DualBeam system from FEI that integrates both ion and electron beams for FIB (Focused Ion Beam) and SEM (Scanning Electron Microscopy) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution.문서
문서 없음